Interferometer (IFM)

An interferometer is an optical measuring instrument used in metrology to measure lengths, angles, and surface profiles with high precision. It is based on the superposition of light waves and the measurement of interference patterns.

The operation of an interferometer is based on the principle of interference, where two or more light waves converge and superimpose to produce an interference pattern. The properties of the interference pattern are then used to perform measurements.

A typical interferometer consists of a light source, a beam splitter, a reference mirror, a test object, and a detector. The light source emits a beam of light that is split into two beams by the beam splitter. One beam is reflected off the reference mirror, while the other beam is directed towards the test object. The reflected beam from the reference mirror and the reflected beam from the test object converge again at the beam splitter, producing an interference pattern on the detector.

By analyzing the interference pattern, precise measurements can be made, such as lengths, angles, surface profiles, and shapes. The measurement accuracy depends on the coherence length of the light source, the stability of the components, and the quality of the interference pattern.

Interferometers are used in a variety of applications, such as semiconductor manufacturing, the production of optical devices and instruments, metrology, and laser technology. There are different types of interferometers, such as Michelson interferometers, Fizeau interferometers, Twyman-Green interferometers, and Mach-Zehnder interferometers, each optimized for specific applications.

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