Glossary
3
A
B
D
E
F
G
H
I
- Industrial metrology
- Engineering surveying
- Industrial computed tomography
- Interferometer
- Interpolation
K
L
M
- Measurement errors
- Metrology
- Uncertainty of measurement
- Maximum material principle
- Metrology
- Metrology laboratory
- Measurement system analysis
- Macroscopic examination
N
O
P
- Pferch principle
- Pore classes
- Porosity
- Location tolerance
- Photogrammetry
- Plane parallelism
- Gauge blocks
- Parallelism
- Primary profile
- Fit
- Pins
- Point cloud
R
- Roughness measurement
- Reference points
- RPS alignment
- Reverse engineering
- Rapid Prototyping
- Runout tester
- Concentricity
- Roundness tolerance
- Rectangularity
- Traceability
